Anomalous chemical shifts of Cu 2p and Cu LMM Auger spectra of silicate glasses
Description
Chemical states of copper ions in various kinds of silicate glasses were investigated by X-ray photoelectron spectroscopy (XPS) and X-ray-induced Auger electron spectroscopy (XAES). Cu 2p photoelectron peaks of the melt-quenched Cu2O-Al2O3-SiO2 and Cu+/Na+ ion-exchanged Cu2O-Na2O-Al2O3-SiO2 glasses have the same binding energy assigned to Cu(I) state. On the other hand, Cu LMM Auger spectra show different spectral shapes in the respective glasses. Compared with the crystalline compounds Cu2O and CuO and metallic Cu, the chemical shifts of the Cu LMM Auger lines are considered to represent the difference of the relaxation effect of the two-hole final state of Cu due to the electron donation ability of the surrounding elements around Cu in the glasses. Analysis of the spectra of Cu 2p and Cu LMM lines of the melt-quenched Cu2O-Na2O-SiO2 glass shows remarkable X-ray irradiation effects. X-ray induces the Cu 2p peak shifts towards the lower binding energy side and finally it has a lower binding energy than that of metallic Cu. It is assigned to Cu(I) in octahedral coordination as found in the spinel structure. From the detailed analysis of Cu 2p spectra, the changes of the redox of Cu ion and the structural evolution on the glass surface are discussed
Additional details
Identifiers
- DOI
- 10.1016/S0368-2048(03)00126-9;
- arXiv
- arXiv:hep-ph/9710304v1;
- PII
- S0368204803001269;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 131-132
- Journal Issue
- 3
- Journal Page Range
- p. 133-144
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35040898
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; CHEMICAL SHIFT; CHEMICAL STATE; COPPER IONS; GLASS; IRRADIATION; PHYSICAL RADIATION EFFECTS; REDOX POTENTIAL; RELAXATION; SILICATES; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ENERGY; IONIZING RADIATIONS; IONS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.