Published May 2008
| Version v1
Journal article
Mechanical behavior of Mo and Ta wire-reinforced bulk metallic glass composites
- 1. Department of Physics, Sookmyung Women's University, Seoul 140-742 (Korea, Republic of)
- 2. Materials Science and Engineering, Iowa State University, Ames, IA 50011 (United States)
- 3. California State University, M/C 8232, Northridge, CA 91330 (United States)
Description
In this study, 80% volume fraction (vf) composites were fabricated with 0.25 mm Mo or Ta wire combined with Zr57Nb5Al10Cu15.4Ni12.6 bulk metallic glass. Quasistatic compression and tension tests were performed. Neutron diffraction was used to measure in situ internal reinforcement strains inside the composites during compressive loading. The composites demonstrate enhanced toughness, mainly due to ductile reinforcements, as well as excellent damage tolerance associated with relatively strong interface. Mo wire composites show higher strength and toughness than Ta composites
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2007.12.037Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2007.12.037;
- PII
- S1359-6462(07)00902-5;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 58
- Journal Issue
- 9
- Journal Page Range
- p. 763-766
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39067962
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CASTING; COMPRESSION; COPPER ALLOYS; DAMAGE; INTERFACES; METALLIC GLASSES; MOLYBDENUM; NEUTRON DIFFRACTION; NICKEL ALLOYS; NIOBIUM ALLOYS; SCANNING ELECTRON MICROSCOPY; SHEAR; STRAINS; TANTALUM; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.