A diamond anvil cell for x-ray fluorescence measurements of trace elements in fluids at high pressure and high temperature
Creators
- 1. European Synchrotron Radiation Facility, 6 rue Jules Horowitz, BP 220, 38043 Grenoble Cedex (France)
- 2. Universite de Lyon, F-69622 Lyon, France and Laboratoire de Sciences de la Terre, ENS, Lyon CNRS, UMR 5570, Universite Lyon 1, Villeurbanne F-69622 (France)
Description
We present a new diamond anvil cell (DAC), hereafter called the fluoX DAC, dedicated for x-ray fluorescence (XRF) analysis of trace elements in fluids under high pressure and high temperature to 10 GPa and 1273 K at least. This new setup has allowed measurement of Rb, Sr, Y, Zr, with concentrations of 50 ppm to 5.6 GPa and 1273 K. The characteristics of the fluoX DAC consist in an optimized shielding and collection geometry in order to reduce the background level in XRF spectrum. Consequently, minimum detection limits of 0.3 ppm were calculated for the abovementioned elements in this new setup. This new DAC setup coupled to the hard x-rays focusing beamline ID22 (ESRF, France) offers the possibility to analyze in situ at high pressure and high temperature, ppm level concentrations of heavy elements, rare earth elements, and first transition metals, which are of prime importance in geochemical processes. The fluoX DAC is also suitable to x-ray diffraction over the same high pressure-temperature range.
Additional details
Identifiers
- DOI
- 10.1063/1.3100202;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 80
- Journal Issue
- 3
- Journal Page Range
- p. 033906-033906.5
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41016266
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- DIAMONDS; FLUIDS; FLUORESCENCE; GEOCHEMISTRY; HARD X RADIATION; PRESSURE RANGE GIGA PA; RARE EARTHS; SENSITIVITY; SHIELDING; SPECTRA; TRACE AMOUNTS; TRANSITION ELEMENTS; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CARBON; CHEMICAL ANALYSIS; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; METALS; MINERALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PHOTON EMISSION; PRESSURE RANGE; RADIATIONS; SCATTERING; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2009 American Institute of Physics