Published April 23, 2007 | Version v1
Journal article

Epitaxial integration of (0001) BiFeO3 with (0001) GaN

  • 1. Department of Materials Science and Engineering, University of California, Berkeley, California 94720 and Department of Physics, University of California, Berkeley, California 94720 (United States)
  • 2. Department of Materials Science and Engineering, Pennsylvania State University, Pennsylvania 16802-5005 (United States)

Description

Epitaxial growth of (0001)-oriented BiFeO3 thin films on the (0001) surface of GaN has been realized using intervening epitaxial (111) SrTiO3/(100) TiO2 buffer layers. The epitaxial BiFeO3 thin films have two in-plane orientations: [1120]BiFeO3(parallel sign)[1120]GaN plus a twin variant related by a 180 deg. in-plane rotation. BiFeO3 shows an out-of-plane remanent polarization of ∼90 μC/cm2, which is comparable to the remanent polarization of BiFeO3 prepared on (111) SrTiO3 single crystal substrates. The orientation of BiFeO3 realized on GaN provides the maximal out-of-plane polarization of BiFeO3, which is equivalent to a surface charge of 5x1014 electrons/cm2

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
90
Journal Issue
17
Journal Page Range
p. 172908-172908.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2007 American Institute of Physics