The effects of atomic oxygen on polyimide resin matrix composite containing nano-silicon dioxide
- 1. Institute of Fluid Mechanics, Beijing University of Aeronautics and Astronautics, 37th Xueyuan Road Haidian District, Beijing 100083 (China)
Description
To improve the atomic oxygen (AO) resistant characteristics of spacecraft resin matrix composite, nano-silicon dioxide particles were filled into glass fiber/polyimide composite and atomic oxygen exposure experiments were conducted in a ground-based AO effects simulation facility. After the exposure experiment, the surface morphology and surface compositions of the samples were analyzed with SEM and XPS, respectively. The experimental results showed that the AO resistant characteristics of this new composite were improved remarkably; the mass loss and erosion yield fell distinctly. It proves that filling these nano-particles is an effective method to improve the AO resistant characteristics of the composite. The erosion yield of glass fiber/15SiO2/polyimide decreased to 16.4% after a 40-h exposure experiment
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.09.020;
- PII
- S0168-583X(05)01758-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 243
- Journal Issue
- 2
- Journal Page Range
- p. 320-324
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069622
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EROSION; FIBERGLASS; MORPHOLOGY; OXYGEN; PARTICLES; RESINS; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY; YIELDS
- Descriptors DEC
- CHALCOGENIDES; COMPOSITE MATERIALS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; MATERIALS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHOTOELECTRON SPECTROSCOPY; POLYMERS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.