Published January 29, 2009 | Version v1
Journal article Metadata-only

High Resolution PDF Measurements on Ag Nanoparticles

Creators

  • 1. Universidade Estadual de Campinas (Brazil)
  • 2. Brazilian Synchrotron Light Laboratory, Laboratorio Nacional de Luz Sincrotron Sincrotron, CP 6192, 13083-971, Campinas SP (Brazil)
  • 3. University of Guelph (Canada)

Description

The quantitative analysis of structural defects in Ag nanoparticles was addressed in this work. We performed atomic scale structural characterization by a combination of x-ray diffraction (XRD) using the Pair Distribution Function analysis (PDF) and High Resolution Transmission Electron Microscopy (HRTEM). The XRD measurements were performed using an innovative instrumentation setup to provide high resolution PDF patterns

Additional details

Identifiers

DOI
10.1063/1.3086200;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1092
Journal Issue
1
Journal Page Range
p. 102-106
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on synchrotron radiation in materials science
Dates
20-23 Jul 2008
Place
Campinas (Brazil)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41011053
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL DEFECTS; DISTRIBUTION FUNCTIONS; NANOSTRUCTURES; PARTICLES; SILVER; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FUNCTIONS; METALS; MICROSCOPY; SCATTERING; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2009 American Institute of Physics