Raman spectroscopy and X-ray diffraction study of PrMnO3 oriented thin films deposited on LaAlO3 and SrTiO3 substrates

In this study, the X-ray diffraction and Raman spectroscopy studies of PrMnO3 thin films deposited on different substrates are presented. The effect of strain of opposite nature in these films is reported. A significant change in the Raman band position and out-of-plane lattice parameter is observed on the two films. We do observed anomalous softening in one of the Raman mode frequency across the magnetic ordering temperature in both the films. However, the strain induced by the two different substrates does not seem to affect the Raman spectra, differently across the magnetic transition temperature. This is probably due to weak spins-phonons coupling in these films. - Highlights: • A noticeable change in the out-of-plane lattice parameters on the two substrates was observed. • A significant change in the Raman band positions imposed due to different kinds of strain was observed. • Anomalous softening in one of Raman mode across magnetic transition was seen. • The softening was observed around same temperature for both the films. • This is assumed to be probably due to the weak spin–phonon coupling in the films