Published 2007 | Version v1
Journal article Metadata-only

Analysis of uncertainties of gamma-ray energy measurement made with semiconductor spectrometers

Creators

  • 1. Institut yadernykh issledovanij, Kyiv (Ukraine)

Description

Detailed analysis of all possible experimental uncertainties accompanying gamma-ray energy measurements completed with semiconductor spectrometers has been performed. Recommendations are given concerning minimizing such uncertainties, the most optimal procedures for making such investigations are suggested

Additional details

Additional titles

Original title (Russian)
Анализ погрешностей измерений энергии гамма-лучей на полупроводниковых спектрометрах

Publishing Information

Journal Title
Yaderna Fyizika ta Energetika
Journal Issue
no.2/20
Journal Page Range
p. 121-125
ISSN
1818-331X

INIS

Country of Publication
Ukraine
Country of Input or Organization
Ukraine
INIS RN
39030606
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; CALIBRATION; ERRORS; GAMMA DETECTION; GAMMA RADIATION; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; MEASURING METHODS
Descriptors DEC
DETECTION; ELECTROMAGNETIC RADIATION; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY