Tolerance to electron beams of TiO2 film photocatalyst
- 1. Department of Engineering and Applied Sciences, Sophia University, 7-1 Kioi-cho, Chiyoda-ku, Tokyo 102-8554 (Japan)
- 2. Research Unit I, Research and Development Directorate, Japan Aerospace Exploration Agency, 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan)
Description
Highlights: • The surface roughness of TiO2 increased after electron beam (EB) irradiation. • Chemical properties and photocatalytic activity were unchanged on EB irradiation. • TiO2 has sufficient resistance to an EB (480 keV, 2.4 MGy). -- Abstract: In orbit, contamination outgassed from spacecraft materials has been reported to degrade optical systems such as CCD cameras, lenses, mirrors, and optical filters mounted on a spacecraft. We focus on TiO2 photocatalyst to solve this contamination problem. TiO2 has the potential to decompose contaminants and suppress the deterioration of optical systems in orbit. However, the resistance of TiO2 itself to electrically charged particles, i.e., electrons in space, has not been clarified. The TiO2 films were irradiated with an electron beam (EB) with an energy of < 480 eV in a vacuum. The irradiation dose was about 2.4 MGy. Chemical properties, surface morphology, and photocatalytic activity were compared before and after EB irradiation. Almost basic properties except surface roughness were unchanged, and the change of surface roughness was very small. These results indicate that TiO2 has sufficient resistance to an EB.
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2019.137421;
- PII
- S0040609019304407;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 686
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55041510
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; CHARGED PARTICLES; CHEMICAL PROPERTIES; ELECTRON BEAMS; ELECTRONS; IRRADIATION; MIRRORS; MORPHOLOGY; OPTICAL FILTERS; OPTICAL SYSTEMS; PHOTOCATALYSIS; RADIATION DOSES; ROUGHNESS; SPACE VEHICLES; SURFACES; THIN FILMS; TITANIUM OXIDES
- Descriptors DEC
- BEAMS; CATALYSIS; CHALCOGENIDES; DOSES; ELEMENTARY PARTICLES; FERMIONS; FILMS; FILTERS; LEPTON BEAMS; LEPTONS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; SEMICONDUCTOR DEVICES; SURFACE PROPERTIES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; VEHICLES
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.