Investigation of Annealing Temperature on Copper Oxide Thin Films Using Sol-Gel Spin Coating Technique
- 1. Faculty of Electrical Engineering, Universiti Teknologi Mara, 40450 Shah Alam, Selangor (Malaysia)
Description
Copper (II) Oxide or cupric oxide (CuO) is one of the well-known materials studied for thin films applications. This paper was studied on the effect of annealing temperature to CuO thin films using sol-gel method and spin coating technique. The solution was prepared by sol-gel method and the thin films were synthesized at various temperatures from 500°C to 700°C that deposited onto the quartz substrates. After the annealing process, the thin films were uniform and brownish black in colour. The measurements were performed by atomic force microscopy (AFM), surface profiler (SP), two-point probe and Ultraviolet-visible (UV-Vis-NIR) spectrometer. From the optical measurement, the band gap was estimated to be 1.44eV for sample annealed at 550°C. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/340/1/012008Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 340
- Journal Issue
- 1
- Journal Page Range
- [9 p.]
- ISSN
- 1757-899X
Conference
- Title
- 6. International Conference on Electronic Devices, Systems and Applications 2017
- Acronym
- ICEDSA 2017
- Dates
- 7-8 Aug 2017
- Place
- Kuching (Malaysia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52089525
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; COATINGS; COPPER OXIDES; DEPOSITS; MATERIALS; QUARTZ; SOL-GEL PROCESS; SPECTROMETERS; SPIN; SPIN-ON COATING; SUBSTRATES; THIN FILMS; ULTRAVIOLET RADIATION
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; COPPER COMPOUNDS; DEPOSITION; ELECTROMAGNETIC RADIATION; FILMS; HEAT TREATMENTS; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; RADIATIONS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS