Published September 20, 1976
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The analysis of slag and silicate samples with a fully automatic sequential x-ray spectrometer
Description
The application of a fully automatic Philips PW 1220 X-ray spectrometer to the analysis of slag and silicate materials is described. The controlling software, written in BASIC and the operational instructions for the automatic spectrometer as applied in this report are available on request
Availability note (English)
MF available from INIS under the Report Number.Files
15069341.pdf
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Additional details
Publishing Information
- ISBN
- 0 86999 283 X
- Imprint Pagination
- 9 p.
- Report number
- NIM--1834
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 15069341
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- B CODES; METALLURGICAL FLUX; SAMPLE PREPARATION; SILICATES; SLAGS; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- COMPUTER CODES; MEASURING INSTRUMENTS; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROMETERS; SPECTROSCOPY