Published February 17, 2014 | Version v1
Journal article

Electronic states of NO2-exposed H-terminated diamond/Al2O3 heterointerface studied by synchrotron radiation photoemission and X-ray absorption spectroscopy

  • 1. Synchrotron Light Application Center, Saga University, Saga 840-8502 (Japan)
  • 2. NTT Basic Research Laboratories, NTT Corporation, Atsugi 243-0198 (Japan)
  • 3. Department of Electrical and Electronic Engineering, Saga University, Saga 840-8502 (Japan)

Description

The energy band-lineup and the electronic structure of NO2-exposed H-terminated diamond/Al2O3 heterointerface have been investigated by synchrotron radiation photoemission and x-ray absorption near-edge structure (XANES) measurements. It is found that the energy band-lineup is stagger-type, so-called type-II, with its valence band discontinuity of as high as 3.9 eV and its conduction band discontinuity of 2.7 eV. The valence band maximum of the H-terminated diamond surface is positioned at Fermi level as a result of high-density hole accumulation on the diamond side. The XANES measurement has shown that the oxygen-derived interface state locates at about 1–3 eV above the Fermi level

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
104
Journal Issue
7
Journal Page Range
p. 072101-072101.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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