Published 1983
| Version v1
Miscellaneous
A study of microdefects in Sb-doped silicon-Czochralski
Creators
- 1. Escola Federal de Engenharia de Itajuba, Minas Gerais (Brazil)
- 2. Sao Paulo Univ. (Brazil). Inst. de Fisica
Description
Published in summary form only
Additional details
Additional titles
- Original title (no language)
- Anais da Escola Brasileira de Fisica de Semicondutores.
Publishing Information
- Imprint Title
- Proceedings of the Brazilian Workshop on Semiconductor Physics
- Imprint Pagination
- 36 p.
- Journal Page Range
- p. 28.
- Report number
- INIS-BR--1156
Conference
- Title
- Brazilian Workshop on Semiconductor Physics.
- Dates
- 1-3 Feb 1983.
- Place
- Campinas, SP (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 19069942
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANTIMONY; CRYSTAL DEFECTS; CRYSTAL DOPING; CZOCHRALSKI METHOD; SILICON; SOLID CLUSTERS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; METALS; SCATTERING; SEMIMETALS
Optional Information
- Notes
- Imprint:Anais da Escola Brasileira de Fisica de Semicondutores.