Published September 2010 | Version v1
Journal article

Achieving the ideal strength in annealed molybdenum nanopillars

  • 1. Engineering Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550 (United States)
  • 2. Department of Materials Science and Engineering, University of California, Berkeley, CA 94720 (United States)
  • 3. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

Description

The theoretical strength of a material is the stress required to deform an infinite, defect-free crystal. Achieving the theoretical strength of a material experimentally is hindered by the ability to create and mechanically test an absolutely defect-free material. Here we show that through annealing it is possible to employ the versatility of the focused ion beam (FIB) but recover a mechanically pristine limited volume. Starting with FIB-milled molybdenum pillars, we anneal them in situ in a transmission electron microscope (TEM) producing a molybdenum pillar with a spherical cap. This geometry allows for the maximum stress to occur in the interior of the spherical cap and is ideally suited for experimentally achieving the ideal strength. During in situ compression testing in the TEM the annealed pillars show initial elastic loading followed by catastrophic failure at, or very near, the calculated theoretical strength of molybdenum.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2010.05.052

Additional details

Identifiers

DOI
10.1016/j.actamat.2010.05.052;
PII
S1359-6454(10)00337-X;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
58
Journal Issue
15
Journal Page Range
p. 5160-5167
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43039349
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; COMPRESSION; CRYSTALS; DEFECTS; FAILURES; ION BEAMS; MOLYBDENUM; STRESSES; TESTING; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.