Achieving the ideal strength in annealed molybdenum nanopillars
Creators
- 1. Engineering Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550 (United States)
- 2. Department of Materials Science and Engineering, University of California, Berkeley, CA 94720 (United States)
- 3. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
Description
The theoretical strength of a material is the stress required to deform an infinite, defect-free crystal. Achieving the theoretical strength of a material experimentally is hindered by the ability to create and mechanically test an absolutely defect-free material. Here we show that through annealing it is possible to employ the versatility of the focused ion beam (FIB) but recover a mechanically pristine limited volume. Starting with FIB-milled molybdenum pillars, we anneal them in situ in a transmission electron microscope (TEM) producing a molybdenum pillar with a spherical cap. This geometry allows for the maximum stress to occur in the interior of the spherical cap and is ideally suited for experimentally achieving the ideal strength. During in situ compression testing in the TEM the annealed pillars show initial elastic loading followed by catastrophic failure at, or very near, the calculated theoretical strength of molybdenum.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2010.05.052Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2010.05.052;
- PII
- S1359-6454(10)00337-X;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 58
- Journal Issue
- 15
- Journal Page Range
- p. 5160-5167
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43039349
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; COMPRESSION; CRYSTALS; DEFECTS; FAILURES; ION BEAMS; MOLYBDENUM; STRESSES; TESTING; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; REFRACTORY METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.