Published 1976
| Version v1
Book
New method for long-term slow crack growth testing in hydrogen
Description
Two self-loaded fracture toughness specimens, the environmental test ring (ETR) and the extended compact tension specimen (EXTCT), have been designed to efficiently measure the resistance of materials to slow crack growth in hydrogen environments. In tests lasting up to six months and at hydrogen pressures up to 52 MPa, crack initiation, crack arrest and growth rate data were reproduced for 4340 and Inconel 718 alloys. In addition, the crack growth resistance of high energy rate forged (HERF) 304L and 21-6-9 stainless steels was verified. The test program has shown the EXTCT to be the preferred specimen because it requires less demanding machining, inspection, and assembly procedures, and produces crack arrest information
Additional details
Publishing Information
- Publisher
- Metallurgical Society of AIME.
- Imprint Place
- New York
- Imprint Title
- Effect of hydrogen on behavior of materials
- Imprint Pagination
- p. 631-641.
Conference
- Title
- Conference on effects of hydrogen on behavior of materials.
- Dates
- 7 Sep 1975.
- Place
- Moran, Wyoming, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8320888
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOY-A-286; CORROSION; CORROSION RESISTANCE; CRACKS; FRACTURE PROPERTIES; HYDROGEN; INCONEL 718; MATERIALS TESTING; PIPELINES; STAINLESS STEEL-304L; STAINLESS STEELS; STEELS; TRANSPORT
- Descriptors DEC
- ALLOYS; ALUMINIUM ADDITIONS; CARBON ADDITIONS; CHEMICAL REACTIONS; CHROMIUM ALLOYS; CHROMIUM STEELS; CHROMIUM-NICKEL STEELS; CORROSION RESISTANT ALLOYS; ELEMENTS; HEAT RESISTING ALLOYS; INCONEL ALLOYS; IRON ALLOYS; IRON BASE ALLOYS; MECHANICAL PROPERTIES; MOLYBDENUM ALLOYS; NICKEL ALLOYS; NICKEL BASE ALLOYS; NIOBIUM ALLOYS; NONMETALS; TESTING; TITANIUM ALLOYS; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- Imprint:See CONF-750925--.