Published April 28, 2014
| Version v1
Journal article
High-energy X-ray detection by hafnium-doped organic-inorganic hybrid scintillators prepared by sol-gel method
Creators
- 1. Department of Applied Chemistry, Graduate School of Engineering, Tohoku University, Sendai 980-8579 (Japan)
- 2. Molecular Imaging Center, National Institute of Radiological Sciences, Anagawa 4-9-1, Inage-ku, Chiba 263-8555 (Japan)
- 3. Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
- 4. Advanced Science Research Center, Japan Atomic Energy Agency, 2-4 Shirane, Shirakata, Tokai, Ibaraki 319-1195 (Japan)
Description
With the aim of enhancing the efficiency with which plastic scintillators detect high-energy X-rays, hafnium-doped organic-inorganic hybrid scintillators were fabricated via a sol-gel method. Transmission electron microscopy of sampled material reveals the presence of HfxSi1−xO2 nanoparticles, dispersed in a polymer matrix that constitutes the active material of the X-ray detector. With HfxSi1−xO2 nanoparticles incorporated in the polymer matrix, the absorption edge and the luminescence wavelength is shifted, which we attribute to Mie scattering. The detection efficiency for 67.4-keV X-rays in a 0.6-mm-thick piece of this material is two times better than the same thickness of a commercial plastic scintillator-NE142
Additional details
Identifiers
- DOI
- 10.1063/1.4875025;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 17
- Journal Page Range
- p. 174104-174104.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45088950
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOPED MATERIALS; HAFNIUM; HYDROFLUORIC ACID; LUMINESCENCE; NANOSTRUCTURES; PLASTIC SCINTILLATORS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FLUORINE COMPOUNDS; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; IONIZING RADIATIONS; MATERIALS; METALS; MICROSCOPY; PHOSPHORS; PHOTON EMISSION; RADIATION DETECTION; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC