Published September 1996 | Version v1
Journal article

Mammography imaging studies using a Laue crystal analyzer

  • 1. North Carolina State University, Raleigh, NC 27695 (United States)
  • 2. INFN di Trieste and Universita di Trieste, Trieste (Italy)
  • 3. University of North Carolina, Chapel Hill, NC 27599 (United States)
  • 4. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States)
  • 5. CSRRI, Illinois Institute of Technology, 3301 S. Dearborn, Chicago, IL 60616 (United States)

Description

Synchrotron-based mammography imaging experiments have been performed with monochromatic x-rays in which a Laue crystal placed after the object being imaged has been used to split the beam transmitted through the object. The X27C R ampersand D beamline at the National Synchrotron Light Source was used with the white beam monochromatized by a double crystal Si(111) monochromator tuned to 18 keV. The imaging beam was a thin horizontal line approximately 0.5 mm high by 100 mm wide. Images were acquired in line scan mode with the phantom and detector both scanned together. The detector for these experiments was an image plate. A thin Si(111) Laue analyzer was used to diffract a portion of the beam transmitted through the phantom before the image plate detector. This open-quote open-quote scatter free close-quote close-quote diffracted beam was then recorded on the image plate during the phantom scan. Since the thin Laue crystal also transmitted a fraction of the incident beam, this beam was also simultaneously recorded on the image plate. The imaging results are interpreted in terms of an x-ray schliere or refractive index inhomogeneities. The analyzer images taken at various points in the rocking curve will be presented. copyright 1996 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
67
Journal Issue
9
Journal Page Range
p. 3360.
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
Acronym
SRI '95
Dates
16-20 Oct 1995.
Place
Argonne, IL (United States).

Optional Information

Secondary number(s)
CONF-9510119--.