Published March 1, 2010
| Version v1
Journal article
Microstructure and growth mechanism of Cu ramified aggregates on silicone oil surfaces
- 1. Department of Physics, Zhejiang University, Hangzhou 310027 (China)
- 2. Department of Physics, China Jiliang University, Hangzhou 310018 (China)
- 3. College of Science, Zhejiang University of Science and Technology, Hangzhou 310023 (China)
Description
We study the microstructure and growth mechanism of copper (Cu) ramified aggregates by the optical microscopy and atomic force microscopy. We find that the ramified Cu aggregates exhibit a granular structure with mean size of the single particulate in the range of 30-60 nm. It is interesting that the average width of the ramified aggregates and the mean size of the particulates do not change obviously with the increase of the nominal film thickness. Compared the size distributions of the Cu particulates on the oil surfaces with that of Cu films on glass surfaces, we suggest that the surface morphology and microstructures of Cu aggregates (or films) depend on property of substrates. The interpretation for this phenomenon is also presented.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.07.197Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.07.197;
- PII
- S0040-6090(09)01358-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 10
- Journal Page Range
- p. 2674-2677
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42054741
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COPPER; DISTRIBUTION; GLASS; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURES; OILS; OPTICAL MICROSCOPY; PARTICULATES; SILICONES; SURFACES; THICKNESS; THIN FILMS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; FILMS; METALS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; OTHER ORGANIC COMPOUNDS; PARTICLES; POLYMERS; SILOXANES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.