Published September 1998 | Version v1
Journal article

Comparison study of photoluminescence from InGaN/GaN multiple quantum wells and InGaN epitaxial layers under large hydrostatic pressure

  • 1. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  • 2. Materials Sciences Division, Lawrence Berkeley National Laboratory and Department of Materials Sciences and Mineral Engineering, University of California, Berkeley, California 94720 (United States)
  • 3. Xerox Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, California 94304 (United States)

Description

We report the results of a comparison study of photoluminescence (PL) from an In0.15Ga0.85N/GaN multiple-quantum-well (MQW) sample and an In0.11Ga0.89N thick epitaxial-layer sample, which have very similar band-gap energies. Large hydrostatic pressures were used for our investigations. The PL emissions in both samples were found to shift linearly to higher energy with applied pressure. In the MQW sample, the pressure response of the InGaN is dominated by the GaN layers, which leads to a significantly weaker pressure dependence as compared to the epilayer sample. Our results yield a pressure coefficient of 2.8x10-3eV/kbar for the In0.15Ga0.85N/GaN MQW sample and 4.0x10-3eV/kbar for the In0.11Ga0.89N epilayer. An abrupt decrease of PL intensity in both samples was observed at pressures above 100 kbar, indicating the carriers involved in the radiative recombination processes in the samples originate primarily from the adjacent GaN layers. copyright 1998 American Institute of Physics

Additional details

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
73
Journal Issue
12
Journal Page Range
p. 1613-1615
ISSN
0003-6951
CODEN
APPLAB