Published July 1, 2014
| Version v1
Journal article
A broadband regenerative frequency divider in InGaP/GaAs HBT technology
- 1. School of Microelectronics, Xidian University, Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, Xi'an 710071 (China)
Description
A dynamic divide-by-two regenerative frequency divider (RFD) is presented in a 60-GHz-fT InGaP/GaAs heterojunction bipolar transistors (HBTs) technology. To achieve high operation bandwidth, active loads instead of resistor loads are incorporated into the RFD. On-wafer measurement shows that the divider is operating from 10 GHz up to at least 40 GHz, limited by the available input frequency. The maximum operation frequency of the divider is found to be much higher than fT/2 of the transistor, and also the divider has excellent input sensitivity. The divider consumes 300.85 mW from 5 V supply and occupies an area of 0.47 × 0.22 mm2. (semiconductor integrated circuits)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/35/7/075004Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 35
- Journal Issue
- 7
- Journal Page Range
- [4 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47041048
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- GALLIUM ARSENIDES; GALLIUM PHOSPHIDES; GHZ RANGE; HETEROJUNCTIONS; INDIUM COMPOUNDS; INTEGRATED CIRCUITS; JUNCTION TRANSISTORS; RESISTORS; SEMICONDUCTOR MATERIALS; SENSITIVITY
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; EQUIPMENT; FREQUENCY RANGE; GALLIUM COMPOUNDS; MATERIALS; MICROELECTRONIC CIRCUITS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; TRANSISTORS