Published August 2006
| Version v1
Journal article
High resolution studies of Al satellite lines and Si-projectile X-rays in electron-atom and ion-atom collisions
- 1. Tata Institute of Fundamental Research, Colaba, Mumbai 400 005 (India)
- 2. Department of Astronomy, The Ohio State University, OH 43210-1173 (United States)
Description
A crystal spectrometer has been reconditioned to study highly charged ion-atom collision processes. A self-written LabVIEW based program has been used for stepper motor control and data acquisition. The satellite structures of Kα X-rays of aluminum under 3-12 keV electron impact as well as 40 MeV C4+ ion impact have been studied. The X-ray spectra of highly charged (H-like, He-like and Li-like) Si ions, in collisions with carbon foil are measured and compared with the theoretical model based on R-matrix method. In addition, approximate charge state distribution for 80 MeV Si ions in carbon foil has been estimated from these data
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2006.04.154;
- PII
- S0168-583X(06)00642-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 248
- Journal Issue
- 2
- Journal Page Range
- p. 247-252
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38029517
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALUMINIUM; CARBON; CHARGE STATES; CRYSTALS; ELECTRON-ATOM COLLISIONS; ELECTRONS; FOILS; ION-ATOM COLLISIONS; KEV RANGE 01-10; KEV RANGE 10-100; MEV RANGE 10-100; R MATRIX; RESOLUTION; SILICON IONS; SPECTROMETERS; X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; ELECTROMAGNETIC RADIATION; ELECTRON COLLISIONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; ION COLLISIONS; IONIZING RADIATIONS; IONS; KEV RANGE; LEPTONS; MATRICES; MEASURING INSTRUMENTS; METALS; MEV RANGE; NONMETALS; RADIATIONS; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.