Published 1990 | Version v1
Book Metadata-only

A direct-coupled detector for synchrotron x-radiation using a large format CCD

Creators

  • 1. Dept. of Pathology, UMDNJ-Robert Wood Johnson Medical School, Piscataway, NJ (USA)
  • 2. Princeton Univ., NJ (United States). Dept. of Physics
  • 3. Princeton Scientific Instruments, Monmouth Junction, NJ (USA)
  • 4. Cornell Univ., Ithaca, NY (United States). School of Applied and Engineering Physics

Description

This paper reports on x-ray area detector based on a large format charge-coupled device (CCD) imaging array constructed and characterized. It was found to exhibit high signal to noise ratio, wide dynamic range and high spatial resolution. Tests with both conventional and synchrotron sources showed the detector to be highly suitable for x-ray diffraction studies

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (USA)
Imprint Title
IEEE nuclear science symposium conference record emdash 1990
Imprint Pagination
1636 p.
Journal Page Range
p. 46-54.

Conference

Title
1990 Institute of Electrical and Electronics Engineers (IEEE) nuclear science symposium.
Dates
22-27 Oct 1990.
Place
Arlington, VA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22091688
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; CONSTRUCTION; PERFORMANCE; RADIATION DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; X-RAY DETECTION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DETECTION; DIFFRACTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES

Optional Information

Secondary number(s)
CONF-9010220--.