Published 1977 | Version v1
Journal article

Edge emissions of ion-implanted CdS

  • 1. Hitachi Ltd., Kokubunji, Tokyo (Japan). Central Research Lab.

Description

Edge emissions of CdS crystals implanted with Li+, N+, Ne+ and P+ are studied. Li and P are found to form acceptors and give rise to I1 lines in the blue and donor-acceptor pair recombination emissions in the green. N gives rise to two kinds of I2 lines (excitons bound to neutral donors) and donor-acceptor pair recombination emissions. An acceptor due to a defect is found in N+ and Ne+ implanted CdS. The temperature range of thermal treatment where impurity centers are formed is also investigated. The relationship among impurity centers produced by N+ implantation is, moreover, discussed based upon the results obtained here and previous works. (author)

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics and Chemistry of Solids
Journal Volume
38
Journal Issue
9
Series
J. Phys. Chem. Solids.
Journal Page Range
937-941
ISSN
0022-3697

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