Published 1977
| Version v1
Journal article
Edge emissions of ion-implanted CdS
Creators
- 1. Hitachi Ltd., Kokubunji, Tokyo (Japan). Central Research Lab.
Description
Edge emissions of CdS crystals implanted with Li+, N+, Ne+ and P+ are studied. Li and P are found to form acceptors and give rise to I1 lines in the blue and donor-acceptor pair recombination emissions in the green. N gives rise to two kinds of I2 lines (excitons bound to neutral donors) and donor-acceptor pair recombination emissions. An acceptor due to a defect is found in N+ and Ne+ implanted CdS. The temperature range of thermal treatment where impurity centers are formed is also investigated. The relationship among impurity centers produced by N+ implantation is, moreover, discussed based upon the results obtained here and previous works. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics and Chemistry of Solids
- Journal Volume
- 38
- Journal Issue
- 9
- Series
- J. Phys. Chem. Solids.
- Journal Page Range
- 937-941
- ISSN
- 0022-3697
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 8338913
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANIONS; CADMIUM SULFIDES; CRYSTAL DEFECTS; EMISSION SPECTRA; ION IMPLANTATION; LITHIUM IONS; MONOCRYSTALS; NEON IONS; NITROGEN IONS; PHOSPHORUS IONS
- Descriptors DEC
- ATOMIC IONS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL STRUCTURE; CRYSTALS; INORGANIC PHOSPHORS; IONS; PHOSPHORS; SPECTRA; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Notes
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