Effects of near-source photon scattering at the energy of 60 keV
Description
Compton scattering on electrons in materials in the vicinity of low-energy photon-emitting atoms and in the vicinity of the detector sensitive volume causes a continuous distribution below the full-energy peak (the 'shoulder'). To study effects of the near-source Compton scattering, a collimator was used in front of a planar germanium detector to reduce the near-detector scattering. The measurements show that even a small mass in vicinity of emitting atoms, such as that of a standard calibration source plate (0.59 g), results in a considerable shoulder, whose shape depends very much on the orientation of the source plate. Additional mass near the source causes a strong enlargement of the shoulder, while the shape depends very much on its position. Calculations of single-Compton scattering on electrons in the vicinity of emitting atoms reproduce reasonably well the numbers of pulses and the shapes of the observed shoulders
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2003.12.035;
- PII
- S0168900204001330;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 524
- Journal Issue
- 1-3
- Journal Page Range
- p. 227-235
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Costa Rica
- INIS RN
- 35105613
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COLLIMATORS; COMPTON EFFECT; ELECTRON EMISSION; ELECTRONS; GE SEMICONDUCTOR DETECTORS; KEV RANGE 10-100; MEASURING METHODS; PHOTON EMISSION; RESPONSE FUNCTIONS; SCATTERING
- Descriptors DEC
- BASIC INTERACTIONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELEMENTARY PARTICLES; EMISSION; ENERGY RANGE; FERMIONS; FUNCTIONS; INTERACTIONS; KEV RANGE; LEPTONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.