Published May 1, 2014 | Version v1
Journal article

Swift heavy ion induced recrystallization in cubic silicon carbide: New insights from designed experiments and MD simulations

  • 1. CSNSM, Université Paris-Sud, CNRS-IN2P3, Bât. 108, 91405 Orsay (France)
  • 2. Helsinki Institute of Physics and Department of Physics, University of Helsinki, P.O. Box 43, Helsinki FI-00014 (Finland)
  • 3. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996 (United States)
  • 4. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
  • 5. CIMAP, CEA–CNRS–ENSICAEN-University of Caen, 14070 Caen Cedex 5 (France)
  • 6. Institut PPRIME, ENSMA–CNRS-University of Poitiers, BP 30179, 86962 Futuroscope-Chasseneuil Cedex (France)

Description

3C-SiC single crystals have been initially irradiated in the nuclear energy loss regime with 100 keV Fe ions to fluences ranging from 4 × 1013 to 4 × 1014 cm−2 (i.e. 0.07–0.7 dpa). RBS/C measurements indicate that SiC rapidly becomes amorphous (at ∼0.4 dpa). Two damaged SiC crystals exhibiting a different defective structure have been subsequently irradiated in the electronic energy loss regime with 870 MeV swift heavy (Pb) ions (SHIs) up to a fluence of 4 × 1013 cm−2. Initially fully amorphous SiC layers showed a decrease in size after SHI irradiation with a recrystallization occurring at the amorphous–crystalline interface. On the contrary, partially amorphous crystals for which onset of amorphization just initiated at the damage peak recovered over the entire damage thickness. Variation of amorphous thickness or disorder level has been monitored as a function of Pb ion fluence, which allowed deriving recrystallization kinetics. Data have been fitted with the direct-impact model and recrystallization cross-sections and threshold values for recovery have been determined for both types of initially defective structures. Differences are qualitatively discussed in terms of nature and density of irradiation defects. All experimental trends have been successfully reproduced by molecular dynamics simulations that mimicked thermal spikes induced by SHIs

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2013.10.080

Additional details

Identifiers

DOI
10.1016/j.nimb.2013.10.080;
PII
S0168-583X(14)00121-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
326
Journal Page Range
p. 326-331
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
17. international conference on radiation effects in insulators (REI)
Acronym
REI-2013
Dates
30 Jun - 5 Jul 2013
Place
Helsinki (Finland)

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.