Swift heavy ion induced recrystallization in cubic silicon carbide: New insights from designed experiments and MD simulations
Creators
- 1. CSNSM, Université Paris-Sud, CNRS-IN2P3, Bât. 108, 91405 Orsay (France)
- 2. Helsinki Institute of Physics and Department of Physics, University of Helsinki, P.O. Box 43, Helsinki FI-00014 (Finland)
- 3. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996 (United States)
- 4. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
- 5. CIMAP, CEA–CNRS–ENSICAEN-University of Caen, 14070 Caen Cedex 5 (France)
- 6. Institut PPRIME, ENSMA–CNRS-University of Poitiers, BP 30179, 86962 Futuroscope-Chasseneuil Cedex (France)
Description
3C-SiC single crystals have been initially irradiated in the nuclear energy loss regime with 100 keV Fe ions to fluences ranging from 4 × 1013 to 4 × 1014 cm−2 (i.e. 0.07–0.7 dpa). RBS/C measurements indicate that SiC rapidly becomes amorphous (at ∼0.4 dpa). Two damaged SiC crystals exhibiting a different defective structure have been subsequently irradiated in the electronic energy loss regime with 870 MeV swift heavy (Pb) ions (SHIs) up to a fluence of 4 × 1013 cm−2. Initially fully amorphous SiC layers showed a decrease in size after SHI irradiation with a recrystallization occurring at the amorphous–crystalline interface. On the contrary, partially amorphous crystals for which onset of amorphization just initiated at the damage peak recovered over the entire damage thickness. Variation of amorphous thickness or disorder level has been monitored as a function of Pb ion fluence, which allowed deriving recrystallization kinetics. Data have been fitted with the direct-impact model and recrystallization cross-sections and threshold values for recovery have been determined for both types of initially defective structures. Differences are qualitatively discussed in terms of nature and density of irradiation defects. All experimental trends have been successfully reproduced by molecular dynamics simulations that mimicked thermal spikes induced by SHIs
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.10.080Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.10.080;
- PII
- S0168-583X(14)00121-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 326
- Journal Page Range
- p. 326-331
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 17. international conference on radiation effects in insulators (REI)
- Acronym
- REI-2013
- Dates
- 30 Jun - 5 Jul 2013
- Place
- Helsinki (Finland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023589
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; ATOMIC DISPLACEMENTS; ENERGY LOSSES; HEAVY IONS; IRON IONS; IRRADIATION; KEV RANGE; LEAD IONS; MATERIALS RECOVERY; MEV RANGE; MOLECULAR DYNAMICS METHOD; MONOCRYSTALS; RECRYSTALLIZATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON CARBIDES; SIMULATION; THICKNESS
- Descriptors DEC
- CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; CHARGED PARTICLES; CRYSTALS; DIMENSIONS; ENERGY RANGE; IONS; LOSSES; MANAGEMENT; PHYSICAL RADIATION EFFECTS; PROCESSING; RADIATION EFFECTS; SILICON COMPOUNDS; SPECTROSCOPY; WASTE MANAGEMENT; WASTE PROCESSING
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.