Published 1978
| Version v1
Journal article
Ion-beam spectroscopy on silicon and magnesium in the X-ray range
- 1. Bochum Univ. (Germany, F.R.). Inst. fuer Experimentalphysik 3
- 2. Oxford Univ. (UK)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Ionenstrahlspektroskopische Untersuchungen an Silizium und Magnesium im Roentgenbereich
Publishing Information
- Journal Title
- Verh. Dtsch. Phys. Ges.
- Journal Issue
- no. 2
- Series
- Verh. Dtsch. Phys. Ges.
Conference
- Title
- DPG-meeting on atomic physics, short-time physics, mass spectroscopy, surface physics and thin films, plasma and gas discharge physics, quantum optics.
- Dates
- 6 - 10 Mar 1978.
- Place
- Muenchen, Germany, F.R.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 10438825
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CARBON; FOILS; ION BEAMS; ION SPECTROSCOPY; LIFETIME; MAGNESIUM IONS; MEV RANGE 10-100; SILICON IONS; X-RAY SPECTRA
- Descriptors DEC
- ATOMIC IONS; BEAMS; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; MEV RANGE; NONMETALS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- Short communication only.
- Secondary number(s)
- INKA-Conf--78-045-002.