Schottky diodes from 2D germanane
Creators
- 1. Nanoscience and Nanotechnology Centre, Department of Chemistry, Kumaun University, Nainital, 263001 Uttarakhand (India)
- 2. Department of Chemistry, Virginia Commonwealth University, Richmond, Virginia 23284 (United States)
- 3. Nanomaterials Core Characterization Center, Virginia Commonwealth University, Richmond, Virginia 23284 (United States)
- 4. Department of Physics, Randolph-Macon College, Ashland, Virginia 23005 (United States)
Description
We report on the fabrication and characterization of a Schottky diode made using 2D germanane (hydrogenated germanene). When compared to germanium, the 2D structure has higher electron mobility, an optimal band-gap, and exceptional stability making germanane an outstanding candidate for a variety of opto-electronic devices. One-atom-thick sheets of hydrogenated puckered germanium atoms have been synthesized from a CaGe2 framework via intercalation and characterized by XRD, Raman, and FTIR techniques. The material was then used to fabricate Schottky diodes by suspending the germanane in benzonitrile and drop-casting it onto interdigitated metal electrodes. The devices demonstrate significant rectifying behavior and the outstanding potential of this material.
Additional details
Identifiers
- DOI
- 10.1063/1.4955463;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 109
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48035161
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ATOMS; CASTING; CASTINGS; CLATHRATES; ELECTRODES; ELECTRON MOBILITY; ELECTRONIC EQUIPMENT; FOURIER TRANSFORMATION; GERMANENE; HYDROGENATION; INFRARED SPECTRA; POTENTIALS; SCHOTTKY BARRIER DIODES; SHEETS; STABILITY; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; EQUIPMENT; FABRICATION; GERMANIUM; INTEGRAL TRANSFORMATIONS; METALS; MOBILITY; PARTICLE MOBILITY; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; TRANSFORMATIONS
Optional Information
- Notes
- (c) 2016 Author(s)