Electrically Tunable Wafer-Sized Three-Dimensional Topological Insulator Thin Films Grown by Magnetron Sputtering
Creators
- 1. Department of Material Physics and Chemistry, University of Science and Technology Beijing, Beijing 100083 (China)
- 2. State Key Laboratory of Low-Dimensional Quantum Physics, Tsinghua University, Beijing 100084 (China)
- 3. Corrosion and Protection Center, Key Laboratory for Environmental Fracture (MOE), Institute of Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083 (China)
- 4. Collaborative Innovation Center of Advanced Steel Technology, University of Science and Technology Beijing, Beijing 100083 (China)
- 5. CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190 (China)
- 6. Institute of Microstructure and Property of Advanced Materials, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124 (China)
- 7. School of Microelectronics, University of Science and Technology of China, Hefei 230026 (China)
- 8. School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798 (Singapore)
- 9. Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States)
Description
Three-dimensional (3D) topological insulators (TIs) are candidate materials for various electronic and spintronic devices due to their strong spin-orbit coupling and unique surface electronic structure. Rapid, low-cost preparation of large-area TI thin films compatible with conventional semiconductor technology is the key to the practical applications of TIs. Here we show that wafer-sized Bi 2 Te 3 family TI and magnetic TI films with decent quality and well-controlled composition and properties can be prepared on amorphous SiO 2 /Si substrates by magnetron cosputtering. The SiO 2 /Si substrates enable us to electrically tune (Bi 1–x Sbx)2 Te 3 and Cr-doped (Bi 1–x Sbx)2 Te 3 TI films between p-type and n-type behavior and thus study the phenomena associated with topological surface states, such as the quantum anomalous Hall effect (QAHE). This work significantly facilitates the fabrication of TI-based devices for electronic and spintronic applications. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0256-307X/37/5/057301Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics Letters
- Journal Volume
- 37
- Journal Issue
- 5
- Journal Page Range
- [10 p.]
- ISSN
- 0256-307X
- CODEN
- CPLEEU
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54074714
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANTIMONY ADDITIONS; BISMUTH TELLURIDES; DOPED MATERIALS; ELECTRONIC STRUCTURE; HALL EFFECT; L-S COUPLING; MAGNETRONS; SEMICONDUCTOR MATERIALS; SILICON; SILICON OXIDES; SPUTTERING; SUBSTRATES; SURFACES; THIN FILMS; THREE-DIMENSIONAL LATTICES
- Descriptors DEC
- ALLOYS; ANTIMONY ALLOYS; BISMUTH COMPOUNDS; CHALCOGENIDES; COUPLING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; INTERMEDIATE COUPLING; MATERIALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS; TELLURIDES; TELLURIUM COMPOUNDS