Stochastic bounded consensus tracking of leader—follower multi-agent systems with measurement noises and sampled-data
Creators
- 1. The Key Laboratory for Advanced Process Control of Light Industry of the Ministry of Education, School of Internet of Things Engineering, Jiangnan University, Wuxi 214122 (China)
Description
This paper is concerned with the stochastic bounded consensus tracking problems of leader—follower multi-agent systems, where the control input of an agent can only use the information measured at the sampling instants from its neighbours or the virtual leader with a time-varying reference state, and the measurements are corrupted by random noises. The probability limit theory and the algebra graph theory are employed to derive the necessary and sufficient conditions guaranteeing the mean square bounded consensus tracking. It is shown that the maximum allowable upper boundary of the sampling period simultaneously depends on the constant feedback gains and the network topology. Furthermore, the effects of the sampling period on the tracking performance are analysed. It turns out that from the view point of the sampling period, there is a trade-off between the tracking speed and the static tracking error. Simulations are provided to demonstrate the effectiveness of the theoretical results. (interdisciplinary physics and related areas of science and technology)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/21/12/128902Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 21
- Journal Issue
- 12
- Journal Page Range
- [8 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45026483
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGEBRA; COMPUTERIZED SIMULATION; CONTROL; ERRORS; FEEDBACK; GAIN; GRAPH THEORY; NOISE; PERFORMANCE; PROBABILITY; RANDOMNESS; SAMPLING; STOCHASTIC PROCESSES; TOPOLOGY
- Descriptors DEC
- AMPLIFICATION; MATHEMATICS; SIMULATION