Published 2010
| Version v1
Miscellaneous
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Characterization by X-ray photoelectron spectroscopy of TiOx thin films prepared by magnetron sputtering
Creators
- 1. Universidade Federal de Sao Carlos (DEMa/UFSCAR), SP (Brazil). Dept. de Engenharia de Materiais
- 2. Laboratorio Nacional de Luz Sincrotron (LNLS), Campinas, SP (Brazil)
- 3. Ecole Nationale Superieure de Chimie de Paris (France)
Description
no abstract available
Files
44083043.pdf
Files
(10.4 kB)
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Additional details
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--12609
Conference
- Title
- 9. Brazilian MRS meeting
- Original Conference Title
- 9. Encontro da SBPMat: Sociedade Brasileira de Pesquisa em Materiais
- Dates
- 24-28 Oct 2010
- Place
- Ouro Preto, MG (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 44083043
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- INTERFACES; MAGNETRONS; OXYGEN; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; TITANIUM OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS