TEM characterization of a Cr/Ti/TiC graded interlayer for magnetron-sputtered TiC/a-C:H nanocomposite coatings
Creators
- 1. Department of Applied Physics, Materials Science Center and the Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen (Netherlands)
Description
A TiC/a-C:H nanocomposite coating is deposited on top of a Cr/Ti/TiC graded interlayer. Cross-section transmission electron microscopy is employed to investigate the detailed structure of the interlayer and the coating. Five different phases are formed as a consequence of the compositional gradient within the interlayer: pure Cr, a solid solution of Ti in Cr, a Ti/Cr amorphous/nanocrystalline phase, α-Ti and TiC. Solid state amorphization occurs during the interlayer deposition to give a dispersion of TiCr β-phase nanocrystals in an amorphous matrix. The TiC phase is textured and contains numerous stacking faults as a result of the growth in under-stoichiometric carbon concentration. C-enriched columnar boundaries are present within the coating, originating from the TiC column boundaries of the interlayer. The work indicates that an interlayer of amorphous/nanocrystalline Ti/Cr phase would reduce the presence of growth defects such as columnar boundaries within nanocomposite TiC/a-C:H coatings
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2005.04.040;
- PII
- S1359-6454(05)00276-4;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 53
- Journal Issue
- 14
- Journal Page Range
- p. 3925-3934
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37055853
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; CARBON; COATINGS; CRYSTALS; DEFECTS; DEPOSITION; MAGNETRONS; NANOSTRUCTURES; SOLID SOLUTIONS; SOLIDS; STACKING FAULTS; STOICHIOMETRY; TITANIUM CARBIDES; TITANIUM-ALPHA; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISPERSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; HOMOGENEOUS MIXTURES; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MIXTURES; NONMETALS; SOLUTIONS; TITANIUM; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.