Energy resolution characteristics of high purity germanium detector
- 1. Dept. of Physics, Dr. Babasaheb Ambedkar Marathwada Univ., Aurangabad (India)
- 2. Radiation Safety Systems Div., Bhabha Atomic Research Centre, Mumbai (India)
Description
The necessary considerations which are taken care for performing accurate measurements of gamma ray attenuation coefficient involves the knowledge of the energy of the photons emitted from the source, the purity of the absorbers, efficiency and energy resolution characteristic of detector as a function of photon energy and sample thickness, and also the effect of geometry on the amount of scattered radiation reaching the detector. In the present investigation the values of percentage resolution and gamma ray attenuation coefficient μ have been obtained and they are found to vary with sample thickness. This dependence is investigated as function of μt for the elements chromium (Z = 24) and lead (Z = 82). The results indicated that the gamma ray attenuation coefficients would improve if one follows the counting sequence together with the criterion μt < 1, where A is the gamma ray attenuation coefficient and t is the thickness of the sample. Here we present investigations at 0.279 MeV for both elements. (author)
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- International symposium on nuclear physics. V. 43B
- Imprint Pagination
- 605 p.
- Journal Page Range
- p. 470-471
Conference
- Title
- International symposium on nuclear physics
- Dates
- 18-22 Dec 2000
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 32063285
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHROMIUM; ENERGY RESOLUTION; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; LEAD; MEV RANGE; PERFORMANCE TESTING; PHOTONS; RADIATION ATTENUATION TESTING; RADIATION SCATTERING ANALYSIS
- Descriptors DEC
- BOSONS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MASSLESS PARTICLES; MATERIALS TESTING; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NONDESTRUCTIVE TESTING; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; TESTING; TRANSITION ELEMENTS
Optional Information
- Notes
- 2 refs.