Published July 21, 2006
| Version v1
Journal article
Reconstruction of the refractive index gradient by x-ray diffraction enhanced computed tomography
Creators
- 1. Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)
- 2. Department of Physics, University of Science and Technology of China, Hefei 230026 (China)
Description
The computed tomography technique cannot easily be extended to diffraction enhanced imaging (DEI) because, while from DEI we may extract the refractive index gradient in one dimension, from the conventional CT reconstruction algorithm we may reconstruct only a scalar quantity. However, recently we showed that changing the direction of the scan axis, and collecting a set of data related to the three-dimensional distribution of the refractive index gradient of the sample, a CT image was obtained. The algorithm we used is based on the conventional CT algorithm but with a specific pre-processing of the projection data. The mathematical framework of the procedure and a simple CT experiment are presented and discussed
Availability note (English)
Available online at http://stacks.iop.org/0031-9155/51/3391/pmb6_14_007.pdf or at the Web site for the journal Physics in Medicine and Biology (ISSN 1361-6560) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0031-9155/51/3391/pmb6_14_007.pdf; http://www.iop.org/;
- DOI
- 10.1088/0031-9155/51/14/007;
- PII
- S0031-9155(06)21166-7;
Publishing Information
- Journal Title
- Physics in Medicine and Biology
- Journal Volume
- 51
- Journal Issue
- 14
- Journal Page Range
- p. 3391-3396
- ISSN
- 0031-9155
- CODEN
- PHMBA7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38003833
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Descriptors DEI
- ALGORITHMS; COMPUTERIZED TOMOGRAPHY; IMAGE PROCESSING; REFRACTIVE INDEX; SCALARS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; MATHEMATICAL LOGIC; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; SCATTERING; TOMOGRAPHY