Surface channel effect on γ-ray response functions of coaxial germanium detectors
- 1. Department of Physics, Konan University, Okamoto 8-9-1, Higashinada, Kobe 658-8501 (Japan)
- 2. Japan Nuclear Cycle Development Institute, Tokai-mura, Ibaraki-ken 319-1194 (Japan)
Description
A surface channel formed in a coaxial germanium detector degrades the pulse-height of output signals. The pulse-height degradation gives rise to an enhancement of low pulse-height events in γ-ray response functions at the cost of the full-energy peak. This phenomenon was closely examined for a twin coaxial-germanium detector. It was found that imperfect charge collection is primarily caused by p-type surface channels and supplemented by the n+-i and i-p+ boundaries, producing low-energy events both in the valley between the full-energy peak and the Compton edge and on the hill below the Compton edge. It is shown that experimental response functions of the twin Ge can be reproduced with high precision by incorporating the imperfect charge collection in Monte Carlo simulations in a phenomenological way
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.04.062;
- PII
- S0168-9002(05)01050-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 548
- Journal Issue
- 3
- Journal Page Range
- p. 455-463
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37042453
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGE COLLECTION; COMPUTERIZED SIMULATION; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; PEAKS; RESPONSE FUNCTIONS; SURFACES
- Descriptors DEC
- CALCULATION METHODS; ELECTROMAGNETIC RADIATION; FUNCTIONS; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.