Published August 2000
| Version v1
Journal article
A moire deflectometer used to measure high temperature plasma electron density
Creators
- 1. Shanghai Inst. of Laser Plasma, Shanghai (China)
- 2. Shanghai Inst. of Optics and Fine Mechanics, Shanghai (China)
Description
Moire deflection measurement can be used to calculate refractive index by measuring deflection of probe beam passing through mediums. A Moire deflectometer is designed, which can measure electron density spatial distribution of high-temperature high-density plasma using soft X-ray laser as probe, and a basal demonstration is given
Additional details
Publishing Information
- Journal Title
- High Power Laser and Particle Beams
- Journal Volume
- 12
- Journal Issue
- 4
- Journal Page Range
- p. 467-470
- ISSN
- 1001-4322
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 32003407
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ELECTRON DENSITY; LASERS; MEASURING INSTRUMENTS; PLASMA DENSITY; REFRACTIVE INDEX; SOFT X RADIATION; SPATIAL DISTRIBUTION; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- DISTRIBUTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; TEMPERATURE RANGE; X RADIATION