Published May 1, 2020 | Version v1
Journal article

New trends in silicon detector technology

Creators

  • 1. FBK-CMM, via Sommarive 18, Trento (Italy)

Description

Modern detector science and technology has originated from High Energy Physics experiment needs in the '80's of the past century, based on the achievement and knowledge of the silicon industry of the time. The first segmented array of diodes (a microstrip sensor) was developed to track vertices at the NA11 experiment at the SPS accelerator at CERN (Geneva, CH) . During the following years, detector technology developed into a special branch of the huge silicon technology enterprise that has been arguably the biggest contributor to the evolution of most of the economical, social and scientific activities of mankind. If, and how, detector technology for science has kept the pace with the spectacular speed of evolution of mainstream silicon technology (namely, the microelectronics industry) is the object of this paper, that will also point out the special requirements of detectors for science and how these can be linked to modern microelectronics trends.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/15/05/C05057

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
15
Journal Issue
05
Journal Page Range
p. C05057
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52079047
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCELERATORS; CERN; HIGH ENERGY PHYSICS; MICROELECTRONICS; PARTICLE TRACKS; SENSORS; SI SEMICONDUCTOR DETECTORS; SILICON; VELOCITY
Descriptors DEC
ELEMENTS; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; PHYSICS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS