Published 1995 | Version v1
Journal article

A beta ray spectrometer based on a two-, or three-element silicon detector coincidence telescope

  • 1. Ben-Gurion Univ. of the Negev, Beersheba (Israel). Dept. of Physics
  • 2. Ontario Hydro, Whitby, ON (Canada). Health Physics Dept.

Description

The operation of a beta ray energy spectrometer based on a two-or three-element silicon detector telescope is described. The front detector (A) is a thin, totally depleted, silicon surface barrier detector either 40 μm, 72 μm or 98 μm thick. The back detector (C) is a Li compensated silicon detector, 5000 μm thick. An additional thin detector can be inserted between these two detectors when additional photon rejection capability is required in intense photon fields. The capability of the spectrometer to reject photons is based on the fact that incident photons will have a small probability of simultaneously losing detectable energy in two detectors and an even smaller probability of losing detectable energy in all three detectors. Electrons, however, above a low energy threshold, will always record simultaneous, events in all three detectors. The spectrometer is capable of measuring electron energies from a lower energy coincidence threshold of 70 keV with 60% efficiency increasing to 100% efficiency in the energy region between 150 keV and 2.5 MeV. (Author)

Additional details

Publishing Information

Journal Title
Radiation Protection Dosimetry
Journal Volume
61
Journal Issue
1-3
Journal Page Range
p. 53-56.
ISSN
0144-8420
CODEN
RPDODE

Conference

Title
applications and research needs in health physics and dosimetry.
Acronym
International workshop on advances in radiation measurements
Dates
3-6 Oct 1994.
Place
Chalk River, ON (Canada).

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
28005849
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BETA SPECTROMETERS; COINCIDENCE SPECTROMETRY; ENERGY RESOLUTION; PERFORMANCE; RADIATION PROTECTION; SI SEMICONDUCTOR DETECTORS; TELESCOPE COUNTERS
Descriptors DEC
COINCIDENCE METHODS; COUNTING TECHNIQUES; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROMETERS

Optional Information

Secondary number(s)
CONF--941027; EUR--16177-EN.