Trapping of highly charged ions with an electrostatic ion trap
- 1. Laboratoire Kastler Brossel, CNRS, ENS, Universite P. et M. Curie Paris-6, 75252 Paris CEDEX 05 (France)
- 2. Department of Physics, Coimbra University, P-3000 Coimbra (Portugal)
Description
In the current contribution, we present our first results with an electrostatic ion trap which has been constructed at LKB (Laboratoire Kastler Brossel) in collaboration with the Weizmann institute. The electrostatic ion trap is composed of two coaxial electrostatic mirrors, working for charged particles in the same way as a Fabry-Perot interferometer works for light in the optical regime. The trap has been attached to the beamline of SIMPA (Source d'ions Multichargs de Paris) an Electron Cyclotron Resonance Ion Source (ECRIS) at LKB (Laboratoire Kastler Brossel) and INSP (Institut des NanoSciences de Paris). The trap is foreseen to be applied for various studies on highly charged ions; as measurements of the life times of metastable states, mass spectroscopy etc. First results for trapping highly-charged ions are presented and simulations in order to explain the observed behavior are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/163/1/012110Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 163
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 14. international conference on the physics of highly charged ions
- Acronym
- HCI 2008
- Dates
- 1-5 Sep 2008
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41097798
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ECR ION SOURCES; ELECTROSTATIC MIRRORS; FABRY-PEROT INTERFEROMETER; MASS SPECTROSCOPY; METASTABLE STATES; MULTICHARGED IONS; NANOSTRUCTURES; SIMULATION
- Descriptors DEC
- CHARGED PARTICLES; ENERGY LEVELS; EXCITED STATES; INTERFEROMETERS; ION SOURCES; IONS; MEASURING INSTRUMENTS; MIRRORS; SPECTROSCOPY