Published April 1, 2009 | Version v1
Journal article

Trapping of highly charged ions with an electrostatic ion trap

  • 1. Laboratoire Kastler Brossel, CNRS, ENS, Universite P. et M. Curie Paris-6, 75252 Paris CEDEX 05 (France)
  • 2. Department of Physics, Coimbra University, P-3000 Coimbra (Portugal)

Description

In the current contribution, we present our first results with an electrostatic ion trap which has been constructed at LKB (Laboratoire Kastler Brossel) in collaboration with the Weizmann institute. The electrostatic ion trap is composed of two coaxial electrostatic mirrors, working for charged particles in the same way as a Fabry-Perot interferometer works for light in the optical regime. The trap has been attached to the beamline of SIMPA (Source d'ions Multichargs de Paris) an Electron Cyclotron Resonance Ion Source (ECRIS) at LKB (Laboratoire Kastler Brossel) and INSP (Institut des NanoSciences de Paris). The trap is foreseen to be applied for various studies on highly charged ions; as measurements of the life times of metastable states, mass spectroscopy etc. First results for trapping highly-charged ions are presented and simulations in order to explain the observed behavior are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/163/1/012110

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
163
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
14. international conference on the physics of highly charged ions
Acronym
HCI 2008
Dates
1-5 Sep 2008
Place
Tokyo (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41097798
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ECR ION SOURCES; ELECTROSTATIC MIRRORS; FABRY-PEROT INTERFEROMETER; MASS SPECTROSCOPY; METASTABLE STATES; MULTICHARGED IONS; NANOSTRUCTURES; SIMULATION
Descriptors DEC
CHARGED PARTICLES; ENERGY LEVELS; EXCITED STATES; INTERFEROMETERS; ION SOURCES; IONS; MEASURING INSTRUMENTS; MIRRORS; SPECTROSCOPY