Published November 15, 2013 | Version v1
Journal article

Absolute detection efficiencies for keV energy atoms incident on a microchannel plate detector

Description

The absolute detection efficiencies of a microchannel plate detector (MCP) were determined experimentally for neutral hydrogen, carbon, and tungsten atoms with impact energies of 0.5–4.5 keV. We measured detection efficiencies using our recently developed method, which uses coincidence counting between neutralized incident ions and ionized target atoms in single-electron capture collisions. The obtained detection efficiencies showed similar impact-energy and mass dependence to those of rare gas atoms (Ne, Ar, Kr, and Xe), measured previously using our method. The detection efficiencies increased with increasing impact energy and converged to the open area ratio (∼50%) of the MCP used. The efficiencies at fixed energies decreased as the mass of the incident atom increased. The absolute detection efficiencies obtained for H, C, W, Ne, Ar, Kr, and Xe atoms could be scaled according to the average electron emission yield estimated using the formulas for electronic and nuclear stopping powers

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2013.03.026

Additional details

Identifiers

DOI
10.1016/j.nimb.2013.03.026;
PII
S0168-583X(13)00359-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
315
Journal Page Range
p. 51-54
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
25. international conference on atomic collisions in solids
Acronym
ICACS-25
Dates
21-25 Oct 2012
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45067528
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; CARBON; COINCIDENCE METHODS; DETECTION; EFFICIENCY; ELECTRON CAPTURE; ELECTRON EMISSION; HYDROGEN; IONS; KEV RANGE; MASS; MICROCHANNEL ELECTRON MULTIPLIERS; STOPPING POWER; TUNGSTEN; YIELDS
Descriptors DEC
CAPTURE; CHARGED PARTICLES; COUNTING TECHNIQUES; ELECTRON MULTIPLIERS; ELECTRON TUBES; ELEMENTS; EMISSION; ENERGY RANGE; METALS; NONMETALS; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.