Atomic hydrogen cleaning of GaAS Photocathodes
Description
It is well known that surface contaminants on semiconductors can be removed when samples are exposed to atomic hydrogen. Atomic H reacts with oxides and carbides on the surface, forming compounds that are liberated and subsequently pumped away. Experiments at Jefferson lab with bulk GaAs in a low-voltage ultra-high vacuum H cleaning chamber have resulted in the production of photocathodes with high photoelectron yield (i.e., quantum efficiency) and long lifetime. A small, portable H cleaning apparatus also has been constructed to successfully clean GaAs samples that are later removed from the vacuum apparatus, transported through air and installed in a high-voltage laser-driven spin-polarized electron source. These results indicate that this method is a versatile and robust alternative to conventional wet chemical etching procedures usually employed to clean bulk GaAs
Availability note (English)
Available from PURL: https://www.osti.gov/servlets/purl/755829-d5cmTL/webviewable/Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 80 Kilobytes
- Report number
- DOE/ER--40150-1476
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 31034545
- Subject category
- S42: ENGINEERING; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- CEBAF ACCELERATOR; ELECTRON SOURCES; GALLIUM ARSENIDES; PHOTOCATHODES; PORTABLE EQUIPMENT; SURFACE CLEANING; VACUUM SYSTEMS
- Descriptors DEC
- ACCELERATORS; ARSENIC COMPOUNDS; ARSENIDES; CATHODES; CLEANING; ELECTRODES; EQUIPMENT; GALLIUM COMPOUNDS; LINEAR ACCELERATORS; PARTICLE SOURCES; PNICTIDES; RADIATION SOURCES; SURFACE FINISHING
Optional Information
- Contract/Grant/Project number
- AC05-84ER40150
- Funding organization
- USDOE Office of Energy Research (ER) (United States)
- Secondary number(s)
- JLAB-ACC--97-03