Published January 1, 1997 | Version v1
Report

Atomic hydrogen cleaning of GaAS Photocathodes

Description

It is well known that surface contaminants on semiconductors can be removed when samples are exposed to atomic hydrogen. Atomic H reacts with oxides and carbides on the surface, forming compounds that are liberated and subsequently pumped away. Experiments at Jefferson lab with bulk GaAs in a low-voltage ultra-high vacuum H cleaning chamber have resulted in the production of photocathodes with high photoelectron yield (i.e., quantum efficiency) and long lifetime. A small, portable H cleaning apparatus also has been constructed to successfully clean GaAs samples that are later removed from the vacuum apparatus, transported through air and installed in a high-voltage laser-driven spin-polarized electron source. These results indicate that this method is a versatile and robust alternative to conventional wet chemical etching procedures usually employed to clean bulk GaAs

Availability note (English)

Available from PURL: https://www.osti.gov/servlets/purl/755829-d5cmTL/webviewable/

Additional details

Publishing Information

Imprint Pagination
80 Kilobytes
Report number
DOE/ER--40150-1476

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
31034545
Subject category
S42: ENGINEERING; S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CEBAF ACCELERATOR; ELECTRON SOURCES; GALLIUM ARSENIDES; PHOTOCATHODES; PORTABLE EQUIPMENT; SURFACE CLEANING; VACUUM SYSTEMS
Descriptors DEC
ACCELERATORS; ARSENIC COMPOUNDS; ARSENIDES; CATHODES; CLEANING; ELECTRODES; EQUIPMENT; GALLIUM COMPOUNDS; LINEAR ACCELERATORS; PARTICLE SOURCES; PNICTIDES; RADIATION SOURCES; SURFACE FINISHING

Optional Information

Contract/Grant/Project number
AC05-84ER40150
Funding organization
USDOE Office of Energy Research (ER) (United States)
Secondary number(s)
JLAB-ACC--97-03