Published August 15, 1991
| Version v1
Journal article
Detection of strongly ionizing particles with a hydrogenated amorphous silicon detector
Creators
- 1. INFN, Rome (Italy)
- 2. Rome-1 Univ. (Italy). Dipt. di Fisica
Description
We report here the first results obtained with an ultrarelativistic (200A GeV/c) sulphur beam impinging on a hydrogenated amorphous silicon (a-Si:H) detector with p-i-n structure. In addition, measurements with α-particles (241Am) are reported in order to compare our detectors with other detectors already constructed by different laboratories. This is a novel type of device; it is presently under development and shows promising characteristics as a particle detector. In this article our results are discussed mainly in terms of the specific ionization rate. For this purpose a comparison is made with the published data obtained with low-energy protons and alphas. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A
- Journal Volume
- 306
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 182-186
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23002398
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALPHA PARTICLES; AMORPHOUS STATE; ION BEAMS; IONIZATION; RADIATION DETECTION; SI SEMICONDUCTOR DETECTORS; SULFUR IONS; TESTING; TEV RANGE 01-10
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; DETECTION; ENERGY RANGE; HELIUM IONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; TEV RANGE