Published March 1, 2019
| Version v1
Journal article
Use of a hybrid semiconductor pixel detector as a precision beam monitor at CERN accelerator facilities
Creators
- 1. Laboratoire de l'Accélérateur Lineaire (LAL), Universite Paris-Sud 11, Centre Scientifique d'Orsay, B.P. 34, Orsay Cedex, F-91898 France (France)
- 2. CERN, European Organization for Nuclear Research, CH-1211 Geneva 23 (Switzerland)
Description
We describe the performance of the Timepix silicon detector operation at the SPS and H8 extracted beam line at CERN. Some detector calibration results and tuning will be discussed and a new cluster analysis algorithm, to reconstruct the particle hits, is described as well. We investigated the optimal acquisition setup for the Timepix device in order to use its full capabilities. A setup of 4 planes of the Timepix hybrid silicon pixel detector is tested as a hodoscope in the H8 180 GeV/c extracted pion beam, and also with a special 3 ns channeled proton bunch sequence inside the SPS accelerator. Spatial and angular distributions are measured.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/14/03/P03018Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 14
- Journal Issue
- 03
- Journal Page Range
- p. P03018
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51050501
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATOR EXPERIMENTAL FACILITIES; ACCELERATORS; ACCURACY; ALGORITHMS; ANGULAR DISTRIBUTION; BEAM MONITORS; CALIBRATION; CERN; CLUSTER ANALYSIS; EQUIPMENT; HODOSCOPES; PARTICLES; PERFORMANCE; PION BEAMS; PROTONS; SEMICONDUCTOR MATERIALS; SI SEMICONDUCTOR DETECTORS; SILICON; TUNING
- Descriptors DEC
- BARYONS; BEAMS; DATA ANALYSIS; DATA PROCESSING; DISTRIBUTION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; INTERNATIONAL ORGANIZATIONS; MATERIALS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MESON BEAMS; MONITORS; NUCLEONS; PARTICLE BEAMS; PROCESSING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS