Published July 1, 2006 | Version v1
Journal article

Preliminary study to optimize the irradiation condition for future application in small animal CT

  • 1. Dipartimento di Fisica 'E. Fermi', Universita' di Pisa, e Sezione INFN di Pisa, Pisa (Italy)

Description

In digital imaging the ability to detect low contrast details is an aim that must be pursued. In order to achieve this result we have developed an acquisition system based on silicon pixel detector. The detector is a matrix of 256x256 square pixels of 55 μm size. It is bump-bonded to a readout chip developed by the Medipix2 Collaboration [X. Llopart, et al., IEEE Trans. Nucl. Sci, NS-49 (5) (2002) 2279]. To see the low contrast details with this system, it is necessary to reduce inside the image the fluctuations of pixel-to-pixel counts, down to statistical fluctuations. This has been achieved equalizing the phantom image with a high statistics flat field acquired in the same irradiation condition. We have studied the dependence of the image uniformity for different flat field and we have investigated the dependence of the image quality on the thickness of the phantom and on the energy window selected inside the incident spectrum

Additional details

Identifiers

DOI
10.1016/j.nima.2006.01.079;
PII
S0168-9002(06)00188-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
563
Journal Issue
1
Journal Page Range
p. 142-145
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
7. international workshop on radiation imaging detectors
Acronym
IWORID 2005
Dates
4-7 Jul 2005
Place
Grenoble (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38034994
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCIDENTS; ANIMALS; FLUCTUATIONS; IMAGES; IRRADIATION; PHANTOMS; SI SEMICONDUCTOR DETECTORS; SILICON; THICKNESS
Descriptors DEC
DIMENSIONS; ELEMENTS; MEASURING INSTRUMENTS; MOCKUP; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; STRUCTURAL MODELS; VARIATIONS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.