Published February 1, 2010 | Version v1
Journal article

Temperature effects on the chemical composition of nickel-phosphorus alloy thin films

  • 1. Department of Mechanical Engineering, Engineering Building, 57 Campus Drive, University of Saskatchewan, Saskatoon, SK, S7N 5A9 (Canada)
  • 2. School of Engineering, University of British Columbia Okanagan, 3333 University Way, Kelowna, B.C. V1V 1V7 (Canada)
  • 3. Saskatchewan Structural Science Centre, University of Saskatchewan, 110 Science Place, Saskatoon, SK, S7N 5C9 (Canada)
  • 4. School of Pharmacy, University of Waterloo, 200 University Avenue West, Waterloo, ON, N2L 3G1 (Canada)
  • 5. Canadian Light Source Inc., 101 Perimeter Road, Saskatoon, SK, S7N 0X4 (Canada)

Description

Electroless Ni-P (EN) alloys are widely used as coating materials. Their properties depend on the level of phosphorus present and the extent of thermal treatment. We report the results of two complimentary electronic structure techniques, X-ray absorption near edge structure (XANES) and X-ray photoelectron spectroscopy (XPS), and the site-specific surface chemistry in EN alloys of different phosphorus compositions and thermal treatments. In XANES experiment, absorption at the Ni L3,2 edge and the P K edge were measured and the P 2p, Ni 2p, and Ni 3p bands were measured by XPS. Heating EN alloys to high temperatures result in a competitive reaction between phosphorus and nickel on the surface for oxygen. There is an increase in the level of phosphates and other forms of phosphorus oxides and a decrease in the oxidized nickel on the surface of the EN alloy thin film. Changes in the electronic structure and chemical composition in the bulk of the EN alloy are not obvious.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.09.007

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.09.007;
PII
S0040-6090(09)01452-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
8
Journal Page Range
p. 2045-2049
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.