Published 1990 | Version v1
Miscellaneous Metadata-only

Roentgenospectral method of silicon content determination in alloys

Creators

  • 1. Tadzhikskij Gosudarstvennyj Univ., Dushanbe (USSR)

Description

Short note

Additional details

Publishing Information

Imprint Title
11. Conference on analytical atomic spectroscopy with International participation
Imprint Pagination
480 p.
Journal Page Range
p. 392.
Report number
INIS-SU--275

Conference

Title
11. Conference on analytical atomic spectroscopy.
Dates
29 Jul - 4 Aug 1990.
Place
Moscow (USSR).

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
22075384
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ALUMINIUM ALLOYS; QUANTITATIVE CHEMICAL ANALYSIS; SILICON; SILICON ALLOYS; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
ALLOYS; CHEMICAL ANALYSIS; ELEMENTS; NONDESTRUCTIVE ANALYSIS; SEMIMETALS; X-RAY EMISSION ANALYSIS