Published March 2010 | Version v1
Journal article

Properties of TiO2-based transparent conducting oxide thin films on GaN(0001) surfaces

  • 1. Kanagawa Academy of Science and Technology (KAST), Kawasaki 213-0012 (Japan)
  • 2. Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Sendai 980-8577 (Japan)
  • 3. Toyoda Gosei Co., Ltd., Nishikasugai, Aichi 452-8564 (Japan)
  • 4. Department of Chemistry, University of Tokyo, Tokyo 113-0033 (Japan)

Description

Anatase Nb-doped TiO2 transparent conducting oxide has been formed on GaN(0001) surfaces using a sputtering method. Amorphous films deposited at room temperature were annealed at a substrate temperature of 500 deg. C in vacuum to form single-phase anatase films. Films with a thickness of 170 nm exhibited a resistivity of 8x10-4 Ω cm with absorptance less than 5% at a wavelength of 460 nm. Furthermore, the refractive index of the Nb-doped TiO2 was well matched to that of GaN. These findings indicate that Nb-doped TiO2 is a promising material for use as transparent electrodes in GaN-based light emitting diodes (LEDs), particularly since reflection at the electrode/GaN boundary can be suppressed, enhancing the external quantum efficiency of blue LEDs.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
107
Journal Issue
5
Journal Page Range
p. 053110-053110.4
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2010 American Institute of Physics