Properties of TiO2-based transparent conducting oxide thin films on GaN(0001) surfaces
Creators
- 1. Kanagawa Academy of Science and Technology (KAST), Kawasaki 213-0012 (Japan)
- 2. Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Sendai 980-8577 (Japan)
- 3. Toyoda Gosei Co., Ltd., Nishikasugai, Aichi 452-8564 (Japan)
- 4. Department of Chemistry, University of Tokyo, Tokyo 113-0033 (Japan)
Description
Anatase Nb-doped TiO2 transparent conducting oxide has been formed on GaN(0001) surfaces using a sputtering method. Amorphous films deposited at room temperature were annealed at a substrate temperature of 500 deg. C in vacuum to form single-phase anatase films. Films with a thickness of 170 nm exhibited a resistivity of 8x10-4 Ω cm with absorptance less than 5% at a wavelength of 460 nm. Furthermore, the refractive index of the Nb-doped TiO2 was well matched to that of GaN. These findings indicate that Nb-doped TiO2 is a promising material for use as transparent electrodes in GaN-based light emitting diodes (LEDs), particularly since reflection at the electrode/GaN boundary can be suppressed, enhancing the external quantum efficiency of blue LEDs.
Additional details
Identifiers
- DOI
- 10.1063/1.3326943;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 107
- Journal Issue
- 5
- Journal Page Range
- p. 053110-053110.4
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42069817
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; ANNEALING; CRYSTAL STRUCTURE; DEPOSITION; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRODES; GALLIUM NITRIDES; LIGHT EMITTING DIODES; NIOBIUM; QUANTUM EFFICIENCY; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SPUTTERING; SURFACE PROPERTIES; SURFACES; THIN FILMS; TITANIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; EFFICIENCY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; GALLIUM COMPOUNDS; HEAT TREATMENTS; MATERIALS; METALS; NITRIDES; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; REFRACTORY METALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2010 American Institute of Physics