Published November 30, 2008 | Version v1
Journal article

Metal-semiconductor interface in extreme temperature conditions

  • 1. St. Petersburg State University of Low Temperatures, Lomonosova 9, St. Petersburg 191002 (Russian Federation)
  • 2. CINVESTAV del IPN, Unidad Queretaro, 76230 Queretaro (Mexico)
  • 3. CIMAV, Miguel de Cervantes 120, 31109 Chihuahua (Mexico)

Description

We present an investigation of electrons' and phonons' temperatures in the volume of a semiconductor (or metal) sample and at the interface between metal and semiconductor. Two types of mismatch between electrons' and phonons' temperatures take place: at metal-semiconductor interfaces and in the volume of the sample. The temperature mismatch leads to nonlinear terms in expressions for heat and electricity transport. The nonlinear effects should be taken into consideration in the study of electrical and heat transport in composites and in electronic chips

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.07.007

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.07.007;
PII
S0169-4332(08)01584-5;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
3
Journal Page Range
p. 659-661
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
11. international conference on the formation of semiconductor interfaces
Acronym
ICFSI-11
Dates
19-24 Aug 2007
Place
Manaus (Brazil)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40087038
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC CONDUCTIVITY; ELECTRICITY; ELECTRONS; HEAT; INTERFACES; NONLINEAR PROBLEMS; PHONONS; SEMICONDUCTOR MATERIALS; TEMPERATURE DEPENDENCE; THERMAL CONDUCTION
Descriptors DEC
ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ENERGY; ENERGY TRANSFER; FERMIONS; HEAT TRANSFER; LEPTONS; MATERIALS; PHYSICAL PROPERTIES; QUASI PARTICLES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.