Published July 2010 | Version v1
Journal article

Influence of gamma-irradiation on photoelectric parameters of pSi-n(Si2)1-x(CdS)x and pSi-n(Si2)1-x(ZnSe)x structures

  • 1. AS RU, Physical-Technical Institute, Tashkent (Uzbekistan)

Description

Influence of small-dose γ-irradiation on relaxation process of non-equilibrium carriers in solid solution (Si2)1-x(CdS)x, the photosensitivities of pSi-n(Si2)1-x(CdS)x and pSi-n(Si2)1-x(ZnSe)x structures and the current-voltage characteristics of pSi-n(Si2)1-x(ZnSe)x structure has been studied. It has been shown that small-dose irradiation results in decreasing concentration of efficient recombination centres, increasing relaxation time of solid solution (Si2)1-x(CdS)x and increasing the photosensitivities of pSi-n(Si2)1-x (CdS)x structure at photon energy Eph = 2.40 eV and that of pSi-n(Si2)1-x(ZnSe)x structure at Eph = 2.54 eV. (authors)

Additional details

Publishing Information

Journal Title
Uzbekiston Fizika Zhurnali
Journal Volume
12
Journal Issue
4-6
Journal Page Range
p. 378-383
ISSN
1025-8817

Optional Information

Notes
6 refs., 3 figs., 1 tab.