Published February 2, 2009 | Version v1
Journal article

Hydrazine-based deposition route for device-quality CIGS films

  • 1. IBM T. J. Watson Research Center, P. O. Box 218, Yorktown Heights, NY 10598 (United States)
  • 2. IBM Almaden Research Center, 650 Harry Rd, San Jose, CA 95120 (United States)

Description

A simple solution-based approach for depositing CIGS (Cu-In-Ga-Se/S) absorber layers is discussed, with an emphasis on film characterization, interfacial properties and integration into photovoltaic devices. The process involves incorporating all metal and chalcogenide components into a single hydrazine-based solution, spin coating a precursor film, and heat treating in an inert atmosphere, to form the desired CIGS film with up to micron-scaled film thickness and grain size. PV devices (glass/Mo/CIGS/CdS/i-ZnO/ITO) employing the spin-coated CIGS and using processing temperatures below 500 deg. C have yielded power conversion efficiencies of up to 10% (AM 1.5 illumination), without the need for a post-CIGS-deposition treatment in a gaseous Se source or a cyanide-based bath etch. Short-duration low-temperature (T < 200 deg. C ) oxygen treatment of completed devices is shown to have a positive impact on the performance of initially underperforming cells, thereby enabling better performance in devices prepared at temperatures below 500 deg. C

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.10.079

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.10.079;
PII
S0040-6090(08)01311-4;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
7
Journal Page Range
p. 2158-2162
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium L: Thin film chalogenide photovoltaic materials
Acronym
EMRS 2008 spring meeting
Dates
26-30 May 2008
Place
Strasbourg (France)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.