Defect analysis in SiO2 layers by means of the positron lifetime-momentum correlation

Published 2011 | Version v1

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Additional details

Journal Title: Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue: Dresden 2011 issue
Series: Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 46(1)
Journal Page Range: [1 p.]
ISSN: 0420-0195
CODEN: VDPEAZ

Title: 75. Annual meeting of the DPG and combined DPG Spring meeting of the condensed matter section and the section AMOP with further DPG divisions environmental physics, history of physics, microprobes, radiation and medical physics, as well as the working groups energy, equal opportunities, industry and business, information, philosophy of physics, physics and disarmament, young DPG
Dates: 13-18 Mar 2011
Place: Dresden (Germany)

Country of Publication: Germany
Country of Input or Organization: Germany
INIS RN: 42082286
Subject category: S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: ANNIHILATION; CRYSTAL DEFECTS; ENERGY SPECTRA; GAMMA SPECTRA; KEV RANGE 01-10; LAYERS; LIFETIME; LINE WIDTHS; PHOTONS; POSITRON COLLISIONS; POSITRONIUM; SILICON OXIDES; THIN FILMS
Descriptors DEC: BOSONS; CHALCOGENIDES; COLLISIONS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ENERGY RANGE; FILMS; INTERACTIONS; KEV RANGE; MASSLESS PARTICLES; OXIDES; OXYGEN COMPOUNDS; PARTICLE INTERACTIONS; SILICON COMPOUNDS; SPECTRA